Title: Characterization of cellulose nanocrystal surfaces by SPM
Author: Lahiji, R.R.; Reifenberger, R.; Raman, A.; Rudie, Alan W.; Moon, Robert J.
Source: NSTI Nanotechnology Conference and Trade Show, Nanotechnology 2008. Vol. 1-3 CDROM : 2008 June 1-5, Boston, Massachusetts. Boca Raton, FL : CRC Press, 2008: ISBN: 9781420085112 (CD-ROM): 1420085115 (CD-ROM): pages 704-707.
Publication Series: Not categorized
Scanning probe microscopy (SPM) techniques have been used to investigate cellulose nanocrystal (CNC) surface chemistry and mechanical properties. Atomic force microscopy (AFM) was used to measure topography, stiffness, and pull-off force of CNC surfaces exposed to N2 atmosphere with a 0.1% relative humidity (RH). Changes in the stiffness and pull-off force as a function of location along CNC surfaces were used to assess the uniformity in mechanical properties and surface chemistry, respectively. This work showed that the contact geometry affected all measurements and needs to be accounted for in the data analysis. Qualitatively, after taking into consideration effects of contact geometry, we find that the stiffness and pull-off force were reasonably uniform across the CNC length.
Keywords: Atomic force microscopy, cellulose nanocrystals, relative humidity, topography, stiffness, pull-off force, surface roughness, surface chemistry, cellulose fibers, mechanical properties, scanning probe microscopy, nanostructured materials, nanocrystals, crystallization, nanotechnology, humidity, crystalline cellulose, cellulose fibers, stiffness, pull-off force
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Lahiji, R.R.; Reifenberger, R.; Raman, A.; Rudie, Alan W.; Moon, Robert J. 2008. Characterization of cellulose nanocrystal surfaces by SPM. NSTI Nanotechnology Conference and Trade Show, Nanotechnology 2008. Vol. 1-3 CDROM : 2008 June 1-5, Boston, Massachusetts. Boca Raton, FL : CRC Press, 2008: ISBN: 9781420085112 (CD-ROM): 1420085115 (CD-ROM): pages 704-707.
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