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Title: High resolution microtomography for density and spatial infomation about wood structures

Author: Illman, Barbara.; Dowd, Betsy.;

Date: 1999

Source: [SPIE`s 44th Annual Meeting and Exhibition : The International Symposium on Optical Science, Engineering,and Instrumentation : 18-23 July 1999, Colorado Convention Center & Marriott City Center, Denver, Colorado, USA. S.l. : s.n., 1999?].:[7] p. : ill.

Publication Series: Miscellaneous Publication

Description: Microtomography has successfully been used to characterize loss of structural integrity of wood. Tomographic images were generated with the newly developed third generation x-ray computed microtomography (XCMT) instrument at the X27A beamline at the national Synchrotron Light source (NSLS). The beamline is equipped with high-flux x-ray monochromator based on multilayer optics developed for this application. The sample is mounted on a translation stage with which to center the sample rotation, a rotation stage to perform the rotation during data collection and a motorized goniometer head for small alignment motions. The absorption image is recorded by a single-crystal scintillator, an optical microscope and a cooled CCD array detector. Data reconstruction has provided three-dimensional geometry of the heterogeneous wood matrix in microtomographic images. Wood is a heterogeneous material composed of long lignocellulose vessels. Although wood is a strong natural product, fungi have evolved chemical systems that weaken the strength properties of wood by degrading structural vessels. Tomographic images with a resolution of three microns were obtained nonintrusively to characterize the compromised structural integrity of wood. Computational tools developed by Lindquist et al (1996) applied to characterize the microstructure of the tomographic volumes.

Keywords: Wood density, Chemical structure, Cell structure, Wood destroying fungi, Tomography, Biodegradation, Strength, Synchroton x-ray tomography, Microtomography

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Illman, Barbara.; Dowd, Betsy. 1999. High resolution microtomography for density and spatial infomation about wood structures. [SPIE`s 44th Annual Meeting and Exhibition : The International Symposium on Optical Science, Engineering,and Instrumentation : 18-23 July 1999, Colorado Convention Center & Marriott City Center, Denver, Colorado, USA. S.l. : s.n., 1999?].:[7] p. : ill.

 


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